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Phenom XL G2 Desktop SEM

Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm.

The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates your quality control process, providing accurate, reproducible results while freeing up time for value-added work.

The Phenom XL G2 Desktop SEM allow you to:

  • Obtain the quality information you need to discover failures early and rapidly adjust your production process when needed.
  • Automate quality control to process a high volume of samples with fewer chances of human error.
  • Get up to speed quickly with an all-new, easy-to-learn interface ideal for a wide range of applications.

The Phenom XL G2 Desktop SEM features full-screen images and an average time-to image of 60 seconds. The unique CeB6 electron source offers a long lifetime with less maintenance. The small form factor requires little lab space, allowing you to place the microscope exactly where you need it.

Phenom XL G2 Argon-Compatible Desktop SEM

The Thermo Scientific Phenom XL G2 Argon-Compatible Desktop Scanning Electron Microscope (SEM) automates your workflows while providing a stable, non-reactive environment for your reactive sample research.

The Phenom XL G2 Argon-Compatible Desktop SEM offers your research:

  • A non-reactive environment to conduct reactive sample research on samples such as solid state lithium batteries
  • A modality where you can have sample preparation and SEM/EDX analysis in the same workspace
  • A safer way to interface with highly volatile samples such as solid state lithium, enabling the next generation of longer-lasting, eco-friendly batteries

The Phenom XL G2 Argon-Compatible Desktop SEM boasts the same 60-second time to image as the Phenom XL G2 SEM, while also being able to be placed in an argon glove box, assuring the safe analysis of solid state lithium.

s of solid state lithium.

Features

Automation
The Phenom XL G2 Desktop SEM offers seamless automation through the Phenom Programming Interface (PPI), which allows users to control the system via Python scripting. Ideal for repetitive tasks such as particle, pore, and fiber analysis or large SEM image evaluations, this feature automates the workflow for increased efficiency.

Long-Lasting CeB₆ Source
The CeB₆ (cerium hexaboride) electron source provides superior brightness compared to traditional tungsten sources, enabling easier acquisition of highly detailed images. In addition, its extended lifespan reduces the frequency of maintenance, allowing users to plan service intervals in advance.

Eucentric Sample Holder
In applications where sample tilt and rotation enhance data accuracy, the optional eucentric sample holder allows for precise adjustments, significantly speeding up research and improving analytical precision.

Element Identification (EID)
For in-depth material analysis, the Phenom XL G2 can be equipped with an optional energy-dispersive X-ray spectroscopy (EDS) detector, enabling elemental identification through X-ray analysis.

Streamlined Data Collection
The integrated elemental identification (EID) software controls the EDS detector, guiding users through a simple step-by-step process to efficiently collect and organize X-ray data.

SEM/EDX in a Single Workspace
When used inside an argon glove box, the Phenom XL G2 facilitates solid-state lithium battery research by minimizing the risk of sample degradation caused by lithium oxidation, ensuring safe and reliable analysis.

Built-in Sample Integrity
This desktop SEM preserves sample quality by eliminating the need for sample transfers between different instruments, thus saving time and reducing potential contamination risks.

Advancing Lithium Battery Research
The Phenom XL G2 promotes safer and more sustainable lithium battery research, supporting the development of longer-lasting, versatile, and eco-friendly energy storage solutions.

Dry Room Compatibility
This system is fully tested and approved for use in dry room environments, functioning effectively even in conditions with dew points as low as -65°C.

Specifications

Resolution

• ≤10 nm

 

Electron optical magnification range

• 160–200.000x

Acceleration voltages

• Default: 5 kV, 10 kV and 15 kV

• Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode

Detectors

• Backscattered electron detector (standard)

• Energy-dispersive X-ray spectroscopy detector (optional)

• Secondary electron detector (optional)

Vacuum modes

• Low – medium – high

Sample size

• Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)

• Max. 40 mm (h)

Manufacturer

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