Talos F200S G2 TEM
TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification.
The Thermo Scientific Talos F200S (S)TEM is a (scanning) transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS). The Talos F200S (S)TEM features great versatility and high through in STEM imaging and allows for precise EDS analysis and high-resolution TEM (HRTEM) for dynamic microscopy.
Talos F200S G2 Transmission Electron Microscope advantages
The Thermo Scientific Talos F200S 200kV (S)TEM combines fast, multichannel, high-resolution (S)TEM imaging and precise compositional analysis to enable dynamic microscopy applications. With innovative features designed to increase throughput, precision, and ease of use, the Talos (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.
Features
Intuitive software
Equipped with Thermo Scientific Velox Software for rapid and straightforward acquisition and analysis of multimodal data.
Precise chemical composition data
Provides fast and accurate quantitative EDS analysis through two in-column Thermo Scientific SDD Super-X Detectors, revealing nanoscale details with exceptional cleanliness.
Enhanced image data
High-throughput (S)TEM imaging with simultaneous detection of multiple signals produces superior contrast for high-quality images.
Upgrade capability
Easily field-upgradable to the Thermo Scientific Talos F200X (S)TEM.
Increased stability
The instrument enclosure minimizes environmental sensitivity by mitigating the effects of air pressure fluctuations, air currents, and minor temperature variations in the TEM room.
Expanded capabilities
Accommodate application-specific in situ sample holders for dynamic experiments.
Easy maintenance – Source exchange can be completed easily by users of any experience level. Straightforward design gives you high up-time, with rapid service when attention is needed.
Specifications
• 0.10 nm
• 0.16 nm
• >150 nA
• System: 2 SDD windowless design, shutter-protected
• Resolution: ≤136 eV for Mn-Kα and 10 kcps (output)
• Fast EDS mapping: Pixel dwell times down to 10μs
• Net solid angle: 0.45 srad
• α±35˚
• β±30˚