Fischione 1051 TEM Mill
Features
For many advanced materials, TEM is the optimal technique for analyzing structure and properties. The TEM Mill is an exceptional tool for producing thin, electron-transparent specimens required for high-resolution TEM imaging and analysis. By utilizing low-angle ion milling combined with low-energy ion operation, it minimizes irradiation damage and specimen heating.
Low-angle milling is particularly advantageous for preparing layered or composite materials and cross-sectional TEM (XTEM) specimens, as it ensures uniform thinning of dissimilar materials.
- Dual TrueFocus ion sources with independent adjustment
- High-energy operation for rapid milling; low-energy operation for precise polishing
- Consistent small beam diameter across a wide energy range (100 eV to 10 keV)
- Optional liquid nitrogen-cooled specimen stage for temperature-sensitive samples
- Faraday cups for direct beam current measurement from each ion source
- Independent ion source gas control for optimized milling conditions
- Adjustable milling angle range from -15° to +10°
- In situ viewing and image capture for real-time monitoring
- Automatic termination by time, temperature, or laser photodetector (optional)
- Specimen holder and loading station with X-Y adjustment (optional)
- Vacuum or inert gas transfer capsule for contamination-free handling (optional)
Specifications
Two TrueFocus ion sources
Variable energy (100 eV to 10 kV) operation
Beam current density up to 10 mA/cm2
Milling angle range of −15 to +10˚
Choice of single or dual ion source operation
Independent ion source energy control
Manual or motorized (optional) ion source angle adjustment
Adjustable spot size
Faraday cups for the direct measurement of beam current from each ion source; allows optimization and adjustment of the ion source parameters for specific applications
Designed for improved specimen handling and thermal properties; includes loading station
Holder clamping mechanism allows for simple specimen loadin and double-sided milling to 0° without shadowing
Specimen holder and loading station with x-y adjustment capabilities (optional)
Specimen size: 3 mm diameter x 250 µm thick 360˚ specimen rotation with variable rotation speed and beam sequencing
Specimen rocking
Magnetic encoder provides absolute positioning accuracy
Liquid nitrogen conductive cooling with integral dewar and automatic temperature interlocks
Dewar access positioned close to instrument operator
Ability to program and maintain a specific temperature between ambient and cryogenic
Instrument operation controlled via 10-inch, adjustable touch screen
Stack light indicator for determining milling operations status from a distance (optional)
Specimen can be monitored in situ in the milling position when using either the stereo or the high-magnification microscope
Viewing window protected by a programmable shutter that prevents buildup of sputtered material and preserves the ability to observe the specimen in situ