Elevate Your SEM Imaging: Precision Ion Milling for Superior Surface Quality

Ion milling is a powerful technique in the physical sciences, refining sample surfaces for enhanced imaging and analysis. By ionizing an inert gas—typically argon—and accelerating it toward the sample, material is precisely sputtered away through controlled momentum transfer.

For advanced materials, SEM is the go-to technique for rapid structural and property analysis. The SEM Mill is engineered to deliver the pristine surface characteristics essential for high-resolution SEM imaging, ensuring exceptional results every time.

• Dual TrueFocus ion sources with independent adjustability
• High-energy operation for fast material removal; low-energy mode for ultra-fine polishing
• Consistently small beam diameter across a wide energy range (100 eV to 10 keV)
• Faraday cups for direct ion beam current measurement
• 10-inch adjustable touchscreen with an intuitive user interface for effortless operation
• Cross-section station (optional) for creating pristine cross-sectional samples
• Independent gas control for optimized milling conditions
• Adjustable milling angles from 0° to +10° for precise control
• In situ viewing and image capture for real-time monitoring
• Sample rocking and rotation with ion beam sequencing for uniform milling
• Automated process termination by time or temperature
• Liquid nitrogen-cooled sample stage (optional) for heat-sensitive materials
• Vacuum or inert gas transfer capsule (optional) for contamination-free sample handling

From routine SEM prep to the most challenging material surfaces, the SEM Mill ensures precision, repeatability, and speed—empowering you to push the boundaries of scientific discovery.