Phenom ParticleX Steel Desktop SEM
Desktop SEM enabling high quality steel manufacturing through failure analysis and process improvement.
Steel microscopy
Metallurgists and researchers in steel manufacturing need scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) data for failure analysis and process improvement. The Thermo Scientific Phenom ParticleX Steel Desktop SEM is a multi-purpose desktop SEM enabling failure analysis and automated characterization of non-metallic inclusions in steel.
Steel inclusion analysis
This versatile solution for high-quality imaging and elemental analysis of steel samples provides the data needed for today’s efficient production of high-value steels. Rapid, easy analysis allows you to quickly respond to customer claims of faults, failures, etc., while the automated steel inclusion analysis provides you insight into the steelmaking process.
Features
Small Footprint
The Phenom ParticleX Steel Desktop SEM needs only standard wall power, allowing it to extend the capabilities of analytical labs without infrastructure changes. The integrated EDS enables users to simply click-and-go to work with elemental mapping and line scan, which shows the quantified element distribution in a line plot.
Ease of use
The user interface is based on the proven ease-of-use technology applied in the successful Phenom Desktop SEMs. The interface enables both existing and new customers to quickly become familiar with the system with a minimum of training. The high brightness of the unique CeB6 source aids in capturing high image detail as well as rapid automated analysis of steel inclusions.
Future-proof
While the default classification rules and analysis recipe allow you to quickly get started with steel inclusion analysis, the classification and recipes are fully customizable. This allows you to capture new insights in updated recipes
Steel inclusion analysis software
Building on years of experience in steel inclusion analysis, default classification rules and analysis recipes allow users to quickly capture valuable data.
Specifications
• <10 nm
• 160–200.000x
• Default: 5 kV, 10 kV and 15 kV
• Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
• Backscattered electron detector (standard)
• Energy-dispersive X-ray spectroscopy detector (standard)
• Secondary electron detector (optional)
• Long lifetime thermionic source (CeB6 )
• Multiple beam currents
• Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
• Max. 40 mm (h)