Unique Field Emission Source
Setting itself apart from other desktop SEMs, the Phenom Pharos G2 FEG-SEM is equipped with a field emission source that ensures exceptional brightness, sharp image quality, and consistent beam current stability.

Outstanding Resolution
With a resolution of 2.0 nm at 20 kV, the Phenom Pharos G2 FEG-SEM delivers impressive clarity, making it ideal for revealing the fine details of nanoparticles, coating defects, and other microscopic features that are often missed by tungsten-based or other tabletop SEMs.

Delicate Sample Imaging
Featuring a voltage range as low as 1 kV, the Phenom Pharos G2 FEG-SEM is well-suited for imaging beam-sensitive samples like polymers and non-conductive materials without the need for a conductive coating, preserving nanoscale surface details.

Increased Efficiency
Despite the complexities often associated with FEG SEMs, the Phenom Pharos G2 FEG-SEM is remarkably user-friendly. It fits on a standard desk and requires less than an hour of training, making it accessible to students, visitors, and researchers who may not have prior experience with high-end SEMs. Users can quickly produce stunning images with minimal effort.

Comprehensive Data Collection
The Phenom Pharos G2 FEG-SEM integrates SE, BSE, and EDS detectors, enabling simultaneous acquisition of both morphological and compositional data. A variety of sample holders are available to support temperature-controlled or electrical experiments, expanding the system’s versatility.