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Spectra 200 TEM

High throughput TEM and STEM microscope for all materials science applications.

For scientists to deepen their understanding of complex samples and innovate new materials, access to robust and precise instruments is essential. These instruments must effectively correlate form and function while resolving spatial, temporal, and frequency dimensions.

Thermo Fisher Scientific proudly presents the Thermo Scientific Spectra 200 (S)TEM, a high-throughput, aberration-corrected scanning transmission electron microscope designed for all materials science applications.

Advantages of the Spectra 200 Scanning Transmission Electron Microscope

All Spectra 200 (S)TEM units are delivered on newly developed platforms that provide an unparalleled level of mechanical stability and top-tier imaging quality through both passive and optional active vibration isolation.

The system is encased in a completely redesigned housing featuring a built-in on-screen display for easy specimen loading and unloading. For the first time, the Spectra 200 offers full modularity and upgradeability between uncorrected and single-corrected configurations with adjustable heights, providing maximum flexibility for various room layouts.

Features

Powered by the ultra-high brightness cold field emission gun (X-CFEG)

The Spectra 200 (S)TEM can be powered by a new-cold field emission gun (X-CFEG). The X-CFEG has extremely high brightness (>>1.0 x 108 A/m2/Sr/V*), low energy spread, and can be operated from 30 – 200 kV. This provides high-resolution STEM imaging with high probe currents for high-throughput, fast acquisition STEM analytics. With the powerful combination of X-CFEG and S-CORR probe aberration corrector, sub-Angstrom STEM imaging with over 1000 pA of probe current can be routinely achieved.
High-angle annular dark-field (HAADF) images of silicon.
Tip flashing on the X-CFEG: 60 pm resolution at 200 kV is maintained before and after a tip flashing without adjustment of the optics. The process takes less than one minute and is required only once per working day and has no impact on the lifetime of the tip.This new generation X-CFEG also produces enough total beam current (>14 nA) to support standard TEM imaging experiments (e.g. in situ) with large parallel probes, making it a uniquely all-purpose, yet high-performance, C-FEG.
High resolution STEM imaging performance for all accelerating voltages
The combination of enhanced mechanical stability, the latest 5th order S-CORR probe aberration correction, and the X-CFEG equips the Spectra 200 (S)TEM with high-resolution, high-contrast STEM imaging capabilities across all accelerating voltages. Furthermore, the Spectra 200 (S)TEM retains the wide gap S-TWIN objective lens as a standard feature from the Themis product line, ensuring customers have a pole gap that provides “room to do more” without sacrificing spatial resolution. The images below demonstrate a remarkable 48 pm resolution achieved with the wide gap S-TWIN Spectra 200 (S)TEM at 200 kV.To enhance user experience, the Spectra 200 (S)TEM is equipped with intelligent software algorithms that quickly, reproducibly, and reliably correct up to 4th order aberrations in the STEM probe (Auto S-CORR) and optimize 1st and 2nd order aberrations for any specimen (OptiSTEM+). As a result, Auto S-CORR can be utilized weekly to maintain high-order aberrations, while OptiSTEM+ can be employed daily to enhance image quality without the need for a standard specimen or manual tuning.

Unprecedended sensitivity with the Panther detection system

STEM imaging on the Spectra 200 (S)TEM has been re-imagined with the Panther STEM detection system, which includes a new data acquisition architecture and two new, solid state, eight-segment ring and disk STEM detectors (16 segments in total). The new detector geometry offers access to advanced STEM imaging capability combined with the sensitivity to measure single electrons.Advanced STEM capabilities

The Spectra 200 (S)TEM can be configured with an electron microscope pixel array detector (EMPAD) or a Thermo Scientific Ceta Camera with speed enhancement to collect 4D STEM data sets.The EMPAD is capable of 30-300 kV and provides a high dynamic range (1:1,000,000 e– between pixels), high signal-to-noise ratio (1/140 e–), and high speed (1100 frames per second) on a 128 x 128 pixel array, which makes it the optimal detector for 4D STEM applications.New possibilities in STEM analytics with Spectra 200 S/TEM

The Spectra 200 (S)TEM is designed to be a powerhouse for STEM analytics. Its extreme brightness and low energy spread, coupled with the latest generation 5th order S-CORR probe corrector, and the wide gap (S-TWIN or X-TWIN) pole piece, create a robust platform for analysis. This configuration, along with a range of large solid-angle and symmetric EDS detectors, and the integrated EDX quantification engine in Thermo Scientific Velox Software, ensures that STEM EDX on the Spectra 200 (S)TEM is fast, straightforward, and quantifiable.The Thermo Scientific EDX detector portfolio offers a variety of detector geometries tailored to meet your experimental needs and optimize EDX results. Both configurations feature a symmetric design (see below), delivering quantifiable data. Additionally, the effects of holder shadowing related to tilt are compensated in both detector configurations through built-in functionality in Velox Software.

Specifications

Uncorrected

• Energy spread: 0.4 eV

• Information limit: 110 pm

• STEM resolution: 164 pm

 

Probe corrector

• Energy spread: 0.4 eV

• Information limit: 110 pm

• STEM resolution: 60 pm

Analytics and detectors

• Super-X/Dual-X EDS options, integrated software, and the Gatan Ultrafast EELS/DualEELS options together provide up to 1000 sp/s of simultaneous EDS and EELS data acquisition

•  Analytics for live peak identification and background fitting during ultra-fast EDS acquisition

• Symmetric EDS detector design allows for combined tomographic EDS

Detector options

• HAADF detector

• On-axis solid state, 8 segmented BF and ADF detectors (16 segments in total)

• Thermo Scientific Ceta 16M Camera (optionally with speed enhancement)

• Gatan OneView/OneView IS cameras

• Gatan energy filter series

• Electron microscope pixel array detector (EMPAD)

Source

• X-CFEG: Ultra-high-brightness cold field emission gun with energy resolution of <0.4 eV

• Flexible high-tension range from 30 – 200 kV

Manufacturer

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