Talos F200i TEM

TEM and STEM analysis for high throughput, high resolution chemical characterization and dynamic observations.

The Thermo Scientific Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.

Talos F200i Transmission Electron Microscope advantages

Designed for multi-user and multi-discipline environments, the Talos F200i (S)TEM is also ideal for novice users. It is equipped with the Thermo Scientific Velox user interface, which is immediately familiar since it is shared across all Thermo Scientific TEM platforms. All TEM daily tunings have been automated to provide the best and most reproducible setup. The Align Genie automation software eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator. A side-entry retractable Energy Dispersive X-ray Spectroscopy (EDS) detector can be added to the configuration to enable chemical analysis.

Compact design

The smaller footprint and dimensions of the Talos F200i facilitate accommodation of this tool in more challenging spaces. In addition, this compact design eases access for service needs while also reducing infrastructure and support costs.

Productivity for all users

To further enhance productivity, especially in multi-user, multi-material environments, the constant-power objective lenses, low-hysteresis design, and remote operation with the SmartCam Camera allow for straightforward reproducible mode and high-tension switches. The Talos F200i (S)TEM also features educational online help. Simply pressing F1 with the mouse hovering over a control panel quickly opens relevant information.

Features

Wide Range of High-Resolution Field Emission Guns (FEG)
Choose from the S-FEG, high-brightness X-FEG, or ultra-high-brightness Cold Field Emission Gun (X-CFEG). The X-CFEG combines top-tier (S)TEM imaging with superior energy resolution for optimal performance.

Dual EDS Technology Options
Select the ideal EDS detector for your needs, ranging from a single 30 mm² detector to dual 100 mm² detectors, perfect for high-throughput or low-dose analytics.

High-Quality STEM/TEM Imaging with Accurate EDS
Capture exceptional STEM or TEM images using the intuitive Velox Software interface. Velox’s unique EDS absorption correction ensures precise quantification, delivering the most accurate results possible.

Comprehensive In Situ Capabilities
Enhance your system with tomography or in situ sample holders. The combination of fast cameras, intelligent software, and the X-TWIN objective lens with its wide gap enables 3D imaging and in situ data collection without sacrificing resolution or analytical power.

Boosted Productivity
The ultra-stable column design and remote operation, supported by the SmartCam Camera and constant-power objective lenses, enable fast mode and high-voltage switches. This ensures efficient transitions in multi-user settings.

Consistent, Repeatable Results
Routine TEM tunings—such as focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points, and rotation center—are fully automated. This allows users to start from optimal imaging conditions every time, ensuring experiments are reproducible and more time can be spent on research rather than adjustments.

High-Speed, Large Field-of-View Imaging
The 4k × 4k Ceta CMOS camera provides a large field of view with high sensitivity and speed, enabling real-time digital zoom across the full high-tension range.

Compact Design
A smaller footprint allows for easy integration into limited spaces, while also reducing infrastructure and maintenance costs.

Specifications

HRTEM line resolution

• ≤0.10 nm

STEM imaging

• ≤0.16 nm (S-FEG/X-FEG)

• ≤0.14 nm (X-CFEG)

• Detectors: HAADF and/or On-axis Panther BF/DF

Vacuum system

• Airlock pumping: Oil- and vibration-free

• Cold trap: Standard

• Long-duration Dewar: Optional – at least 4 days stand-time (between refills)

EDS

• Detector size (Bruker X-flash): 30, 100 or dual 100 mm2

•  Retractable: Yes, motorized

EELS

• ≤0.8 eV (S-FEG/X-FEG)

• ≤0.3 eV (X-CFEG)

Gun brightness 200 kV

• 4×108 A /cm2 srad (S-FEG)

• 1.8×109 A /cm2 srad (X-FEG)

• 2.4×109 A /cm2 srad (X-CFEG)

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