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Talos F200X G2 TEM

TEM microscope for high resolution TEM and STEM with accurate chemical quantification.

Thermo Scientific Talos F200X STEM
The Thermo Scientific Talos F200X STEM is a scanning transmission electron microscope that excels at delivering high-resolution STEM and TEM imaging, paired with industry-leading energy dispersive X-ray spectroscopy (EDS) detection. Its 2D and 3D chemical characterization, achieved through compositional mapping, is powered by four in-column SDD Super-X detectors, ensuring ultra-clean results. The Talos F200X enables rapid, precise EDS analysis in multiple dimensions, while providing high-resolution TEM and STEM imaging (HRTEM and HRSTEM) with swift navigation for dynamic microscopy. Its design also minimizes sensitivity to environmental factors, as the instrument’s enclosure reduces the impact of air pressure fluctuations, airflow, and subtle temperature changes in the lab.

STEM Imaging and Chemical Analysis
The Talos F200X (S)TEM offers fast and accurate quantitative characterization of nanomaterials in multiple dimensions. With advanced features aimed at enhancing throughput, accuracy, and ease of operation, it’s an excellent tool for research and analysis in academic, governmental, semiconductor, and industrial fields.

The demand for large-area, high-resolution correlative imaging has grown, as it allows researchers to retain context while generating statistically significant data. Thermo Scientific Maps Software, powered by Thermo Scientific Velox Software, automates the process by acquiring multiple images across a sample and seamlessly stitching them together into a single large image. This can even be done unattended. The Automated Particle Workflow (APW) pack expands on this by offering unique processing on a dedicated PC with Thermo Scientific Avizo2D Software. This setup allows for automated extraction of nanoparticle parameters such as size, area, perimeter, shape, and contact points. Fully automated and capable of unattended operation, the system ensures 24/7 use of the Talos F200X (S)TEM, significantly improving statistical reliability by eliminating operator bias.

Align Genie Automation Software
This software simplifies the user experience for beginners, alleviates tensions in multi-user labs, and shortens the time-to-data for experienced operators.

Features

Wide Selection of High-Resolution Field Emission Guns (FEG)
Choose from high-brightness X-FEG or ultra-high-brightness Cold Field Emission Gun (X-CFEG), with X-CFEG offering top-tier (S)TEM imaging combined with excellent energy resolution.

User-Friendly Software
Thermo Scientific Velox Software ensures fast and straightforward acquisition and analysis of multimodal data.

Faster Chemical Composition Analysis
Perform quick, accurate quantitative EDS analysis that uncovers nanoscale details in both 2D and 3D, with superior cleanliness.

Enhanced Image Quality
Obtain high-contrast, high-quality images through high-throughput STEM imaging with simultaneous detection of multiple signals for improved contrast.

Expandable for In Situ Experiments
Easily integrate application-specific in situ sample holders to perform dynamic experiments.

High-Quality (S)TEM Imaging and Precise EDS
Capture high-resolution TEM or STEM images using the intuitive Velox Software interface. The software’s unique EDS absorption correction ensures precise quantification of elements.

Consistent Data Collection
Daily TEM adjustments, such as focus, eucentric height, beam shift, condenser aperture, and more, are fully automated, guaranteeing optimal imaging conditions every time. This allows for consistent, reproducible experiments so that you can concentrate on your research rather than equipment setup.

Boosted Productivity
The ultra-stable column, paired with the SmartCam Camera and constant-power objective lenses, enables quick mode and high-voltage (HT) switches, making it easy to operate in multi-user environments.

Specifications

HRTEM line resolution

• ≤0.10 nm

STEM imaging

• ≤0.16 nm (S-FEG/X-FEG)

• ≤0.14 nm (X-CFEG)

 

Super-X EDS system

• 4 SDD symmetric design, windowless, shutter-protected

EELS

• ≤0.8 eV (S-FEG/X-FEG)

• ≤0.3 eV (X-CFEG)

Gun brightness 200 kV

• 1.8×109 A /cm2 srad (X-FEG)

• 2.4×109 A /cm2 srad (X-CFEG)

Manufacturer

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