Scanning Electron Microscopy (SEM) is a key tool in science and industry, enabling researchers to examine surfaces and structures at the nanoscale. First developed in the 1930s by Max Knoll and Ernst Ruska, SEM became widely used by the 1960s and has since become essential across various scientific fields.
SEM works by scanning a focused electron beam over a sample’s surface. The interaction between the electrons and the specimen generates signals that create detailed images, revealing surface topography, composition, and even crystallographic information. SEM offers far greater magnification and depth of field than optical microscopes, with the ability to visualize features down to just a few nanometers.
SEM is versatile, with applications in materials science, biology, semiconductors, forensics, geology, and nanotechnology. It is used to study metals, ceramics, composites, cellular structures, and microorganisms, as well as for quality control in manufacturing. Its broad capabilities make SEM invaluable to both academic researchers and industry professionals.
As a sophisticated imaging and analytical tool, SEM provides both qualitative and quantitative data, making it essential for advancing research, product development, and quality assurance in a wide range of fields.
