Plasma Cleaning for Clearer TEM Imaging of Nanoscale Materials

In transmission electron microscopy (TEM) of nanoscale materials, support films are essential for stabilizing specimens on standard grids. These films are typically amorphous carbon, either free-standing or backed by formvar, a hydrocarbon-based polymer. However, mobile carbonaceous contaminants can migrate to the electron beam’s vicinity, obscuring areas of interest and compromising imaging and analysis.

Plasma cleaning of the specimen grid and side-entry holder effectively removes these contaminants, ensuring clearer, more reliable imaging. To further enhance cleaning efficiency, Fischione Instruments developed a shielded holder port for the Model 1020 Plasma Cleaner.

Optimized Shield Design for Reduced Plasma Exposure

• Slows degradation within the Ar–25% O₂ inductively coupled plasma
• Reduces plasma density near the holder tip by limiting cross-sectional exposure
• Electrically grounded shield aligns concentrically with the holder geometry, ensuring controlled and uniform cleaning

By mitigating contamination and optimizing plasma exposure, this innovation enhances specimen preparation for high-resolution TEM imaging and analysis.